In addition the utilized ceramic ball grid array cbga.
Ceramic bga reliability.
Madsen abstract the white paper component reliability after long term storage texas instruments application.
Ball grid array bga assembly reliability jpl nepp presentation ipc 9701 csp thermal cycle created date.
Also utilized was a 256 leaded and a 256 plastic bga package for evaluating and directly comparing manufacturing robustness and reliability.
Flip chip cbga is a common package for high end microprocessor devices.
Ceramic ball grid array packaging assembly reliability freescale semiconductor.
Substrate based ball grid array bga flip chip bga quad flat leadless stacked chip scale flip chip csp xuejun fan moisture related reliability xuejun fan lamar edu higher performance smaller size cheaper price chip scale and wafer level packaging csp wlp.
A small tape based plastic bga package with 280 balls was included in the study 16 x 16 mm 0 8 mm pitch 9 x 9 depopulated center.
Assemblies with water soluble flux were cleaned in an electrovert h500.
Type 2 ceramic and plastic bga packages with nearly 600 i os.
Balls for this package are 90 pb and 10 sn and attached to the ceramic substrate using eutectic 63sn 37pb solder paste.
Large number of vias within area of bga increases cte locally.
Incoming pcb requirements for cbga freescale semiconductor.
Ceramic ball grid array package drawings bg accept and proceed.
Bga package component reliability after long term storage r.
Lower cte may be used to increase reliability.
Shih et al reliability of hitce ceramic bga packages to be published 2005.
Plastic bga pbga ceramic bga cbga pwb 63sn 37pb eutectic flip chip flip chip bga fcbga column cbga ccga 90pb 10sn high melt i o 600 i o 600.
Flip chip hitce ltcc bga package kyocera provides both ceramic and organic packages for large scale integration lsi devices.
Type 1 ceramic and plastic bga packages with nearly 300 i os.
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